Table of Contents

 Protrain - Everything About Working With Electron Microscopes

M1 A Basic Introduction to the SEM

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Chapter 1 - Imaging and Electron Optics - Magnification -Working Distance and Magnification - Depth of Field & Depth of Focus - Spot Size and Imaging - Spot Size Comparison - Spot Size & Magnification - The TV Image & Photography - The Original Source Electron Gun Components - The Original Source and its Electron Gun Circuit - Electron Lenses - Deflection Coils - Astigmatism - Condenser Lenses - The Final Lens - The Electron Column - Lens Aberrations - Working Distance & Aberrations - External Field Problems

Chapter 2 - Setting Up the Electron Gun - Electron Sources - The Saturation Curve - Electron Beam Control - Saturation and A Wave Form - Generic W Hairpin Operating Procedures - The Filament Image - Saturation by Screen Brightness - LaB6 Saturation - Cold Field Emission - Field Emission Alignment Problems - Field Emission Gun Alignment - Schottky Emitter - Set Up by Screen Brightness - Orchid Gun - Modifications

Chapter 3 - Vacuum Systems - Contamination - Conventional SEM Vacuum Systems - Field Emission Vacuum System

Chapter 4 - General Operating Procedures - Condenser Lens Performance - Aperture Systems - A Guide to Aperture Alignment- Aperture Alignment - A Guide to Photography or Recording and Image - Recording the Image - Tungsten Hairpin Instrument Performance - Comparison FEG "v Tungsten Hairpin - FEG Instrument Performance

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M2 Imaging and Specimen Preparation for SEM

Chapter 1 - Reactions Between the Electron Beam and the Specimen - Elastic and Inelastic Scatter - Electron-Specimen Reaction Volumes - Predicting Reaction Volumes with the Monte Carlo Calculation - Summarising The Reactions

Chapter 2 - Electron Detectors and Signals - The Everhart-Thornley Detector - Backscattered Electron Detectors - Imaging Signals and Shadows - Image Contrast - Specimen Charge - Different Types of Backscattered Image

Chapter 3 - Basic Specimen Preparation - The Objectives When Mounting Specimens - Basic Mounting Principles - Possible Preparation Procedures - Conventional Mounting Procedures - Mounting Powders - Fine Materials the Slide Method - Fine Materials the Filter Method - Mounting Difficult Specimens - Fractures for Cross Sections - Fracturing Difficult Materials

Chapter 4 - Working With Moist Specimens - Drying and Drying Methods - Freezing Techniques - The Freeze Drying Procedure - Critical Point Dryer Procedure - Critical Point Dryer Operation - A Typical CPD Unit - The SEM Cryo Freezing Procedure - Cryo Specimen Manipulation

Chapter 5 - Specimen Coating - All About Coating - Sputter Coating - The Sputtering Plasma - High Vacuum Coating Systems - Carbon String - RP Vacuum Coating Procedures - Improving Sputter Coatings

Chapter 6 - Fine Tuning Performance - The Affects of Working Distance

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M3 Advanced Techniques in SEM

Chapter 1- More on the Reaction Between the Electron Beam & the Specimen - Elastic and Inelastic Scatter - Electron - Specimen Reaction Volumes - Signal Levels - Secondary Electron Signals Contributing to the Image - Highlights in an image - Image Content - BSE - SE - Normal - Backscattered Signals Contributing to the Image - Converted Backscatter

Chapter 2 - Optimising the Accelerating Voltage - Accelerating Voltage and Penetration Volumes - Imaging at 20 Kilovolts - Imaging at 10 Kilovolts - Imaging at 5 Kilovolts - The Reaction Volumes with this Specimen - Electron Emission at Low Accelerating Voltages - Imaging at 2 Kilovolts - Imaging at 1 Kilovolt - The Low Voltage Imaging Transitions - Contrast in Pure Secondary Electron Images - Resolution and Accelerating Voltage

Chapter 3 - Optimising the Electron Source - The Limit of Performance in an SEM - Saturating the Filament - The Three Sources - High Voltage Drift - The Conventional Electron Gun Circuit - Filament Position and Source Size - Optimum Emission Currents - Filament Position Related to Performance and Filament Life - Emission Related to Bias Setting - Accelerating Voltage Related to Emission Level & Source Size - The Lanthanum Hexaboride Filament and its Temperature Adjustment- The Cold Field Emission Source - Field Emission and Tungsten Hairpin Image Quality

Chapter 4 - Optimising Probe Current - Spot Size (Probe Current) Related to Image Quality - An Image "Spot Size Limited" - A Subtle Change and What You Lose - Spot Size and its Affect Upon Reaction Volume - Spot Size Related to Image Type

Chapter 5 - Aperture System Adjustment - Real and Virtual Apertures - Aperture Alignment - Aperture Size and Depth of Field - Visualising Depth of Field

Chapter 6 - Balancing the Working Distance for Resolution and Depth of Field - When Changing Spot Size is the Wrong Step - Accelerating Voltage and Resolution Related to Working Distance - External Fields and Their Affect Upon Performance - Specimen Position and Signal Levels

Chapter 7 - The Use of Specimen Tilt - Bumps and Dips Related to Chamber and Screen Geometry - Two Displays and Image Shadows - Pillars or Holes? - The Advantage of Tilt - Tilting and Magnification

Chapter 8 - Secondary Electron Images for True Surface Information - An Engine Component - A Polymer - A Microchip

Chapter 9 - Backscattered Electron Images for Analytical & in-depth Information - Two Types of Backscattered Electron Images - Sectioning a Specimen Through Accelerating Voltage Variation - Cleaning Up an Image Using a Backscattered Detector - Vacuum Systems in the SEM - Differential Pumping in an LVSEM - Comparing an LVSEM and a Manifold System - The LVSEM Conversion

Chapter 10 - Optimising SEM Performance through Signal Selection - Conventional and In Lens Systems - Twin Detector Systems - The Affect of Detector Position on Image Quality - Very High Resolution with Field Emission -

M4 A Basic Introduction to X-Ray Analysis

Chapter 1 - The Production of X-Rays - Elastic & Inelastic Scatter - Reaction Volumes & Calculations - A Summary of Electron Scatter - Analytical Areas - Characteristic X-Rays - Background X-Rays

Chapter 2 - The Analysis of X-Ray Energy - The Complete Analysis System - The Si(Li) Crystal - The Energy Dispersive X-Ray Detector - The Performance of Detector Windows - Ultra Thin Window Structure - The Pulse Processor - Pulse Processing & Resolution - Pulse Pile Up Rejection Circuit - The Analog to Digital Converter and Display - The EDX Spectrum Display

Chapter 3 - Specimen and Detector Manipulation in the SEM - Mounting the Specimen - Detector Positioning in the SEM - Positioning the Specimen -Specimen and Detector Geometry - Possible and Impossible Analytical Areas

Chapter 4 - Specimen and Detector Manipulation in the TEM - The TEM Specimen Area - Setting the Specimen in the Eucentric Position

Chapter 5 - The Problems Within an Analysis of X-Ray Energy - Calibration - X-Ray Emission Areas in the SEM - X-Ray Emission Areas in the TEM - Accelerating Voltage & The Spectrum - Peak Overlap Investigations - Sum & Escape Peaks in the Spectrum - Escape Peak Production - Sum Peak Production - Reaction Volumes in SEM & TEM

Chapter 6 - Carrying out an Analysis - KLM Lines - What is a Peak? - Control of the X-Ray Counts - Using KLM Markers - KLM Markers and Peak Labels - Expanding the Spectrum - The Analysis Procedure

Chapter 7 - Quantitative Analysis - Quantitative Analysis and ZAF - Quantitative Standards - Detector to Specimen Geometry - A Semi-Quantitative Analysis

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